Thermal Conductivity Testing Instrument
Catalog NO.: AIMRSE-TAI-005 Category: Thermal Analysis Instruments
Thermal Conductivity Testing Instrument is an ultra-short pulse flash method thin film thermal conductivity tester based on the classic laser flash method. It employs an ultra-short pulse laser and ultra-high-speed infrared detector to accurately measure thermal conductivity and thermal diffusivity of micron-thick films, addressing the limitations of conventional laser flash devices for high thermal conductivity thin films.
| Measurement Accuracy | ≤ ± 3% |
| Sample Type | Various inorganic, organic, and composite thin film materials |
| Temperature Range | -50℃～200℃ |
| Test Environment | Air/vacuum/inert atmosphere |
| Test Parameters | Thermal conductivity, thermal diffusivity |
| Sample Size | Diameter φ13～16 mm, sample thickness 0.9 μm～500 μm |
◈ Ultra-Short Laser Pulse: Uses a YAG single-pulse laser with a pulse width of several nanoseconds, satisfying the laser flash method model requirements for thin films and avoiding sample damage.
◈ High-Speed Backside Temperature Measurement: Utilizes a photovoltaic liquid nitrogen-cooled MCT infrared detector with nanosecond response time to acquire complete backside temperature rise curves.
◈ Accurate Thin Film Measurement: Enables more realistic and accurate thermal conductivity testing for micron-thick films in the through-plane direction.
Thermal conductivity and thermal diffusivity testing of various inorganic, organic, and composite thin film materials, such as graphene films, metal films, and polymer films.
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