AIMRSE Advanced Probe Station Laboratory Fig 1: Advanced semiconductor testing laboratory

Precision Probe Systems for Advanced Research

Empowering the next generation of Semiconductor, RF, and Quantum innovations with engineering-grade testing solutions backed by global support.

500+ Global Labs
15 Countries
98% Client Retention

Looking for specific configurations? We specialize in custom engineering.

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Core Product Lines

Engineered for precision, reliability, and performance in the most demanding research and production environments.

AIMRSE offers a complete portfolio of characterization equipment ranging from manual analytical stations to semi-automated wafer probers. Whether you need Cryogenic environments for quantum research, High-Vacuum chambers for low-noise measurements, or High-Power setups for SiC/GaN devices, our modular platforms are built to adapt. We also supply essential precision components including micro-positioners, thermal chucks, and consumables.

Cryogenic Probe Station System Fig 2: High-Vacuum Cryogenic Probe System

Probe Systems

Our comprehensive probe station solutions range from manual analytical stations to fully automated, environmentally controlled systems. Designed to minimize electrical noise and ensure thermal stability.

  • Cryogenic Operation (10mK - 400K) with fast cool-down
  • High-Vacuum & Magnetic Field (up to 9 Tesla)
  • RF / mmWave integration (up to 110 GHz)
  • High Power (10kV / 500A) with arc suppression
View Technical Specifications →

Precision Micro-positioners Fig 3: Sub-micron Precision Micro-positioners

Precision Components

Achieve nanometer-level positioning accuracy and precise temperature control. Our components are designed for modularity, allowing you to upgrade your existing setup effortlessly.

  • Sub-micron Micro-Positioners with zero backlash
  • Thermal Chucks (-65°C to 300°C) with ±0.1°C stability
  • EMI/RFI Shielding Enclosures
  • High-Resolution Microscope Systems & Optics
View Technical Specifications →

Probe Tips and Calibration Substrates Fig 4: RF Calibration Substrates and Probe Tips

Consumables & Accessories

Maintain measurement integrity with our high-quality consumables. All accessories are manufactured to strict tolerances to ensure repeatability and extended lifespan.

  • Tungsten / BeCu / Gold-plated Probe Tips
  • NIST-traceable RF Calibration Substrates
  • Low-leakage Probe Arms & Holders
  • Low-noise Triaxial Cables & Adapters
View Technical Specifications →

Solutions by Application

Tailored configurations optimized for specific industry requirements, ensuring accurate data extraction for your specific device under test (DUT).

Wafer Level Reliability Testing Fig 5: Wafer-level Reliability (WLR) setup

Semiconductor Characterization

Our platforms are engineered for the most demanding parametric analysis. Supporting femto-ampere level IV measurements and high-frequency CV analysis, our systems allow for comprehensive wafer-level reliability (WLR) testing.

  • Low-leakage IV / CV Measurement integration
  • Wafer Level Reliability (HCI, NBTI, TDDB)
  • Failure Analysis & Process Control Monitoring (PCM)
  • 1/f Noise Measurement configurations
Discuss Application

RF S-Parameter Testing Fig 6: mmWave S-Parameter measurement

RF & mmWave Testing

Designed for 5G/6G, radar, and satellite communication devices. Our systems minimize insertion loss and ensure accurate S-parameter extraction up to 110 GHz with precise planarization and calibration support.

  • S-Parameter Measurement (up to 110 GHz)
  • Load Pull & Noise Figure Measurement
  • Supports Calibration (SOLT, LRM, TRL)
  • Integration with Keysight/Rohde & Schwarz VNAs
Discuss Application

Quantum Cryogenic Testing Fig 7: Cryogenic Qubit Characterization

Quantum & Spintronics

Integrated ultra-low temperature and high-magnetic field environments essential for quantum computing research. Our low-vibration designs ensure the stability required for sensitive qubit and spintronic device characterization.

  • Milli-Kelvin Temperatures (< 100mK)
  • Superconducting Magnet Integration (up to 9T)
  • Ultra-low Vibration for Qubit Coherence
  • Wiring for DC, RF, and Fiber Optics
Discuss Application

High Voltage Power Device Testing Fig 8: High Voltage SiC/GaN Testing

Power Electronics (SiC/GaN)

Safe and reliable characterization for Wide Bandgap (WBG) power devices. Our systems feature special anti-arcing environments and interlocks to handle high voltage and current without compromising operator safety.

  • High Voltage (up to 10kV) / High Current (up to 500A)
  • Fluorinert / Special Gas Anti-arcing Solutions
  • Low Contact Resistance Thermal Chucks
  • On-wafer Switching Loss Analysis
Discuss Application

Optoelectronic Wafer Testing Fig 9: Photonic integrated circuit testing

Optoelectronics & Photonics

Precision alignment and testing solutions for VCSELs, Laser Diodes, and Photodetectors. We provide integrated setups for measuring Light-Current-Voltage (L-I-V) characteristics with specialized fiber holders.

  • Double-sided Probing for Vertical Devices
  • Precision Fiber Alignment Stages
  • Wafer-level L-I-V / Spectrum Measurement
  • Temperature Controlled Photonic Testing
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About AIMRSE

AIMRSE is a premier provider of precision testing equipment, dedicated to supporting the semiconductor and scientific research communities in the United States and globally.

Our story is built on a foundation of engineering excellence. We understand that accurate data starts with stable, reliable probing mechanics. From our headquarters, we support a global network of distributors and service engineers ensuring your lab never stops.

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AIMRSE Advanced Semiconductor R&D Laboratory and Precision Equipment Fig 10: AIMRSE Engineering Team

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