Consumables
The Critical Interface: High-Performance Consumables
In any probe station setup, the ultimate quality of the measurement data depends on the integrity of the contact between the probe tip and the device pad. No matter how stable the station or how precise the analyzer, a degraded needle or an improper holder will introduce contact resistance, leakage current, and signal artifacts. Our Consumables division is dedicated to providing high-quality, long-life probe tips and holders designed to minimize these variables.
We offer a comprehensive selection of probe needles manufactured from Tungsten, Beryllium Copper, and Paliney 7, each optimized for specific pad materials and current requirements. Our manufacturing process ensures tip radius accuracy to within ±0.5μm, enabling contact on the smallest modern device geometries. Furthermore, our probe holders are engineered with high-quality dielectric materials to maintain signal shielding all the way to the tip, available in Coaxial, Triaxial, and Kelvin configurations.
Regular maintenance and replacement of consumables are essential for reliable data. We support your lab's operation with bulk packs, custom bending services, and rapid shipping to ensure you never face downtime due to worn components.
Probe Tip Material Selection Guide
| Material | Hardness | Contact Resistance | Best For Pad Material | Key Characteristic |
|---|---|---|---|---|
| Tungsten (W) | High | Medium | Aluminum (Al) | Pierces native oxide layers effectively. Durable. |
| Beryllium Copper (BeCu) | Medium | Low | Gold (Au) | Lower contact resistance. Won't damage soft pads. |
| Paliney 7 | Low | Very Low | Gold / Copper | Non-oxidizing precious metal alloy. Excellent signal. |
| Nickel (Ni) | Medium | Medium | High Temp | Used for high-temperature probing applications. |
Engineering Guide: Choosing the Right Interface
Selecting Probe Tips:
- Pad Material Matching: Use Tungsten for Aluminum pads to break through the oxide layer. Use BeCu for Gold pads to prevent gouging and damaging the sample.
- Tip Radius: Select a radius that is approximately 1/10th of your pad size. (e.g., 5μm tip for a 50μm pad). Too sharp leads to rapid wear; too dull leads to shorting.
- Shape: Straight tips are standard. Bent tips (45° or 90°) provide flexibility in Z-height. Cat-whisker shapes absorb overdrive for delicate membranes.
Selecting Probe Holders:
- Coaxial: Standard for most I-V and C-V tests. The outer shield reduces noise but stops before the tip.
- Triaxial: Mandatory for low-current (<100pA) measurements. The driven guard extends to the tip clamp, eliminating cable leakage.
- Kelvin (4-Point): Essential for measuring low resistances. Uses two needles (Force and Sense) to eliminate contact resistance from the measurement.
- RF / Microwave: Requires specialized GSG/GS/SG probe bodies with defined pitch (e.g., 100μm, 150μm) to match the device layout.
Consumables Categories
Probe Tips (Needles)
We stock a vast inventory of probe tips to meet every testing scenario. Tungsten (W) needles offer high hardness and durability, making them the industry standard for probing aluminum pads. Beryllium Copper (BeCu) needles provide lower contact resistance and are softer, ideal for probing gold pads without causing damage.
Our tips are available in various shank diameters and tip radii ranging from ultra-sharp 0.5μm for sub-micron geometries to 100μm for high-power contact pads. Custom bending (45°/90°) and cat-whisker shapes are available upon request.
View Probe Tips
Cables & Connectors
Signal integrity from the probe to the parameter analyzer relies heavily on cabling. We offer high-grade, low-noise cables specifically designed for semiconductor characterization. Our Triaxial Cables feature superior PTFE insulation and guarded layers, guaranteed to support fA-level leakage measurements.
For high-frequency applications, we provide phase-stable RF/Microwave Coaxial Cables and adapters (SMA, 2.92mm, 1.85mm, 1.0mm) rated up to 67GHz and 110GHz, ensuring minimal insertion loss and excellent VSWR during VNA calibration and testing.
View Cables
Test Consumables & Accessories
Maintain your probe station at peak performance with our specialized test consumables. Oxide buildup on probe tips increases contact resistance; our Probe Tip Cleaning Pads (gel and abrasive varieties) gently remove debris to extend tip life and restore signal quality.
We also supply Impedance Standard Substrates (ISS) for precise RF calibration (SOLT/LRRM), high-voltage insulating fluids (Fluorinert) for power device testing, and precision vacuum tweezers for safe wafer handling.
View Test AccessoriesConsumable Applications
High Power Probing
Large radius Tungsten tips and high-current holders prevent tip burning during high-current pulses.
Low Noise Measurement
Triaxial holders and glass-passivated tips reduce leakage for femtoampere-level characterization.
RF Calibration
Specialized RF probes and impedance standard substrates (ISS) for VNA calibration.
Delicate Structures
Cat-whisker or BeCu probes minimize mechanical stress on MEMS membranes or thin films.
Inventory & Logistics
We understand that running out of consumables means stopping the production line. We offer:
- Rapid Shipping: Most standard tips ship within 24 hours.
- Sample Kits: Assortment boxes to help you find the right tip for new processes.
- Volume Discounts: Competitive pricing for bulk orders.
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
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