Products
Precision Engineering for the Nanoscale World. Our Products Center offers a comprehensive ecosystem for semiconductor characterization. From versatile probe stations to high-precision micro-positioners and essential consumables, we provide the tools necessary for accurate wafer-level testing.
Probe Systems
State-of-the-art platforms for reliable characterization in diverse environments.
Cryogenic Systems
Variable temperature testing down to 4K using LHe/LN2. Vacuum chambers prevent condensation and frost.
- Temp: 4K - 675K
- Vacuum: 10^-6 Torr
- Vibration Isolated
Vacuum Systems
Oxidation-free environment for sensitive materials. Supports high vacuum or inert gas backfilling.
- Atm to 10^-5 mbar
- Stainless Steel Chamber
- For MEMS / Organic
RF / Microwave
High-rigidity platforms with specialized RF platens for precise GSG probe planarization and S-parameter extraction.
- DC to 110 GHz / THz
- ISS Calibration Ready
- VNA Compatible
Magnetic Field
Integrated electromagnets providing horizontal or vertical magnetic fields for Hall effect testing.
- Field: Up to 1.5 Tesla
- 360° Rotatable
- Non-magnetic Arms
High Power
Safety-interlocked systems for high voltage/current testing of Wide Bandgap devices without arcing.
- Up to 10 kV / 100 A
- Anti-arcing Bath
- HV Interlock
Standard / Manual
Cost-effective, modular probe stations for general I-V/C-V testing, ideal for universities and basic R&D.
- Wafer: 2" to 12"
- Coarse/Fine Stage
- Upgradeable
Precision Components
Essential sub-systems ensuring measurement accuracy and stability.
Micro-Positioners
Backlash-free manipulators with magnetic, vacuum, or bolt-down bases for stable probe placement.
- Sub-micron (0.7-0.1μm)
- Linear X-Y-Z
- RF/DC Compatible
Thermal Chucks
Advanced wafer chucks providing uniform temperature control across the wafer surface.
- -60°C to +300°C
- Coaxial / Triaxial
- Gold / Nickel Plated
Microscope Systems
Optical solutions from stereo zoom to high-magnification metallographic systems.
- Long Working Distance
- Up to 2000x Zoom
- CCD Integration
Probe Holders & Arms
Precision probe holders and articulating arms for flexible and stable probe tip positioning.
- Multiple Arm Configurations
- Stable Clamping
- RF/DC Compatible
Anti-Vibration Platforms
Environmental isolation platforms critical for measuring low-level signals (fA currents) by damping vibrations.
- Passive / Active Damping
- Vibration Isolation Table
- EMI Shielding Options
Consumables & Accessories
High-quality essentials ensuring consistent contact and data integrity.
Probe Tips
A wide variety of probe needles tailored for different pad materials and requirements.
- Tungsten (W)
- Beryllium Copper (BeCu)
- Radius: 0.5μm - 100μm
Cables & Connectors
High-quality cables and connectors for reliable signal transmission and system integration.
- Coaxial / Triaxial
- BNC, SMA, 3-Slot Triax
- Low-noise / High-voltage
Test Consumables
Essential consumables for daily testing, maintenance, and calibration of probe systems.
- Cleaning Kits
- Calibration Substrates
- Replacement Parts
Custom Semiconductor Solutions
Need specialized semiconductor components or custom solutions? Our engineering team can develop tailored products for your specific requirements.
Contact Our ExpertsNote: Certain specifications may be subject to configuration.
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
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