Probe Holders & Arms
| Cat | Products Name | Product Highlights | Price |
|---|---|---|---|
| AIMRSE-PC-SC-1 | High Voltage Triaxial Probe Needle | Ultra-low-leakage HV probe | Request a Quote |
| AIMRSE-PC-SC-2 | Coaxial Probe Needle | High-performance coaxial probe | Request a Quote |
| AIMRSE-PC-SC-3 | Multi-Function Probe Holder | Compact multifunctional holder | Request a Quote |
| AIMRSE-PC-SC-4 | Keithley 2600 Series Triaxial Adapter | Triaxial adapter for Keithley | Request a Quote |
| AIMRSE-PC-SC-5 | PT-1200K Coaxial Probe Holder | pA-grade coaxial holder | Request a Quote |
| AIMRSE-PC-SC-6 | PT-1500 Coaxial Probe Holder | High-precision coaxial holder | Request a Quote |
| AIMRSE-PC-SC-7 | PT-1500L L-Type Coaxial Probe Holder | L-type non-interference holder | Request a Quote |
| AIMRSE-PC-SC-8 | PTC-1200 Spring Coaxial Probe Holder | Spring-type gentle contact | Request a Quote |
| AIMRSE-PC-SC-9 | PHG-3000 High Voltage Probe Holder | L-type 3000V HV holder | Request a Quote |
| AIMRSE-PC-SC-10 | PHG-5000 High Voltage Probe Holder | 5000V HV probe holder | Request a Quote |
Overview
Mechanical Design & Electrical Performance
Fig 1: AIMRSE probe arms and holders configured for low‑leakage DC and RF probing applications.
AIMRSE probe arms are constructed from rigid, lightweight materials with precision pivot joints that allow flexible angular positioning while maintaining mechanical stability. The probe holder body accepts standard shank probe tips and provides adjustable spring tension to control contact force, preventing device damage while ensuring low contact resistance. For low‑current measurements, triaxial holders with driven guards eliminate leakage currents below 1 fA. For RF applications, holders are designed for minimal insertion loss and phase stability up to 110 GHz. Kelvin probe configurations provide true four‑wire sensing for accurate resistance and RDS(on) measurements. Our probe arms and holders are essential for low‑leakage I‑V characterization, RF S‑parameter measurements, high‑power device testing, and precision resistance measurements.
Available Probe Holder & Arm Configurations
Triaxial Probe Holders
Leakage Current < 1 fA
Driven guard to force potential eliminates parasitic leakage paths. Essential for low‑current semiconductor characterization, photodetector dark current, and high‑impedance device testing.
Coaxial & RF Probe Arms
DC to 110 GHz, Low Insertion Loss
Impedance‑controlled holders for RF and microwave probing. Compatible with SMA, 2.92 mm, and 1.85 mm interfaces. Maintains calibration integrity for accurate S‑parameters.
Kelvin Probe Holders
True Four‑Wire Sensing
Separate force and sense connections eliminate lead resistance errors. Critical for accurate on‑resistance and contact resistance measurements in power devices and low‑ohmic structures.
Adjustable‑Angle Probe Arms
Multi‑Axis Angular Positioning
Precision pivot joints enable probe tip approach from any angle. Ideal for probing non‑planar devices, edge contacts, and vertical structures.
Core Engineering Advantages
Adjustable Contact Force
Precision spring mechanisms allow the user to set the optimal contact force for the probe tip material and device pad metallurgy. This extends tip life and prevents pad damage while maintaining low contact resistance.
Universal Tip Compatibility
Our holders accept industry‑standard probe tips with shank diameters from 0.020″ to 0.050″. This includes tungsten, beryllium copper, and specialty tips for RF and high‑current applications.
Low‑Noise Shielding
All holders include continuous shielding from the connector to the probe tip. Triaxial holders provide an additional driven guard to eliminate leakage and noise pickup, enabling accurate femtoampere‑level measurements.
Probe Holder & Arm FAQ
What is the difference between triaxial and coaxial holders?
When do I need a Kelvin probe holder?
Can I use the same holder for DC and RF measurements?
What probe tip materials are compatible?
How do I adjust the contact force?
Custom Probe Holder Engineering Services
Need a Specialized Probe Holder Configuration?
From custom connector types and Kelvin configurations to specialized geometries for probing vertical devices or edge contacts, our engineering team can design holders tailored to your unique measurement requirements.
Please specify measurement type (DC, RF, Kelvin), connector requirements, and any special mechanical constraints.
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
Contact Form