Probe Holders & Arms

Request a Quote
Cat Products Name Product Highlights Price
AIMRSE-PC-SC-11 PTC-1200L L-Type Spring Coaxial Probe Holder L-type low leakage holder Request a Quote
AIMRSE-PC-SC-12 PT-1500SG Signal-Ground Separate Probe Holder SG separate probe holder Request a Quote
AIMRSE-PC-SC-13 PH-1500 Triaxial Probe Holder fA-grade triaxial holder Request a Quote
AIMRSE-PC-SC-14 3KV High Voltage Probe Holder 3KV ultra-low leakage holder Request a Quote
AIMRSE-PC-SC-15 DC-2H Coaxial Probe Holder - Straight Rod General purpose coaxial holder Request a Quote
AIMRSE-PC-SC-15-B DC-2Z Z-Type Coaxial Probe Holder Z-type anti-interference holder Request a Quote
AIMRSE-PC-SC-15-C DC-2S Spring Coaxial Probe Holder Spring type coaxial holder Request a Quote
AIMRSE-PC-SC-16 DC-3H Triaxial Probe Holder - Straight Rod fA-level straight triaxial Request a Quote
AIMRSE-PC-SC-16-B DC-3Z Z-Type Triaxial Probe Holder Z-type precision triaxial Request a Quote
AIMRSE-PC-SC-16-C DC-3S Spring Triaxial Probe Holder Spring tilt triaxial holder Request a Quote

Overview

The Critical Link Between Positioner and Device: The probe arm and holder assembly is the final mechanical interface that determines contact quality, leakage current, and high‑frequency performance. At AIMRSE, we manufacture Probe Holders & Arms engineered to provide stable, low‑noise electrical connections for DC, RF, and high‑power applications. Our holders accept industry‑standard probe tips and are available with triaxial, coaxial, and Kelvin configurations. Precision pivot joints and adjustable spring tension ensure consistent contact force and long tip life, while shielded designs minimize noise pickup for sensitive measurements.

Mechanical Design & Electrical Performance

Probe arms and holders with triaxial connectors and adjustable angles Fig 1: AIMRSE probe arms and holders configured for low‑leakage DC and RF probing applications.

AIMRSE probe arms are constructed from rigid, lightweight materials with precision pivot joints that allow flexible angular positioning while maintaining mechanical stability. The probe holder body accepts standard shank probe tips and provides adjustable spring tension to control contact force, preventing device damage while ensuring low contact resistance. For low‑current measurements, triaxial holders with driven guards eliminate leakage currents below 1 fA. For RF applications, holders are designed for minimal insertion loss and phase stability up to 110 GHz. Kelvin probe configurations provide true four‑wire sensing for accurate resistance and RDS(on) measurements. Our probe arms and holders are essential for low‑leakage I‑V characterization, RF S‑parameter measurements, high‑power device testing, and precision resistance measurements.

Available Probe Holder & Arm Configurations

Triaxial Probe Holders

Leakage Current < 1 fA
Driven guard to force potential eliminates parasitic leakage paths. Essential for low‑current semiconductor characterization, photodetector dark current, and high‑impedance device testing.

Coaxial & RF Probe Arms

DC to 110 GHz, Low Insertion Loss
Impedance‑controlled holders for RF and microwave probing. Compatible with SMA, 2.92 mm, and 1.85 mm interfaces. Maintains calibration integrity for accurate S‑parameters.

Kelvin Probe Holders

True Four‑Wire Sensing
Separate force and sense connections eliminate lead resistance errors. Critical for accurate on‑resistance and contact resistance measurements in power devices and low‑ohmic structures.

Adjustable‑Angle Probe Arms

Multi‑Axis Angular Positioning
Precision pivot joints enable probe tip approach from any angle. Ideal for probing non‑planar devices, edge contacts, and vertical structures.

Core Engineering Advantages

Adjustable Contact Force

Precision spring mechanisms allow the user to set the optimal contact force for the probe tip material and device pad metallurgy. This extends tip life and prevents pad damage while maintaining low contact resistance.

Universal Tip Compatibility

Our holders accept industry‑standard probe tips with shank diameters from 0.020″ to 0.050″. This includes tungsten, beryllium copper, and specialty tips for RF and high‑current applications.

Low‑Noise Shielding

All holders include continuous shielding from the connector to the probe tip. Triaxial holders provide an additional driven guard to eliminate leakage and noise pickup, enabling accurate femtoampere‑level measurements.

Probe Holder & Arm FAQ

What is the difference between triaxial and coaxial holders?
A coaxial holder has a single shield for general‑purpose measurements. A triaxial holder adds a second, driven guard shield that eliminates parasitic leakage currents, essential for measurements below 1 pA and for high‑impedance devices.
When do I need a Kelvin probe holder?
Kelvin (four‑wire) holders are necessary when measuring low resistances (< 10 Ω) where lead and contact resistance would otherwise dominate the measurement. This is critical for power device RDS(on), contact resistance test structures, and metal sheet resistance.
Can I use the same holder for DC and RF measurements?
No. RF holders are impedance‑controlled and designed for minimal insertion loss and phase stability. DC holders are not optimized for high frequencies. Using a DC holder for RF will severely degrade measurement accuracy.
What probe tip materials are compatible?
Our holders accept standard shank probe tips in tungsten, beryllium copper (BeCu), and gold‑plated tungsten. Shank diameters of 0.020″ and 0.050″ are standard; adapters for other sizes are available.
How do I adjust the contact force?
A spring‑tension adjustment screw on the holder body allows you to set the desired contact force. We recommend ~20 grams for soft aluminum pads and ~40 grams for gold pads to ensure reliable contact without damage.

Custom Probe Holder Engineering Services

Need a Specialized Probe Holder Configuration?

From custom connector types and Kelvin configurations to specialized geometries for probing vertical devices or edge contacts, our engineering team can design holders tailored to your unique measurement requirements.

Please specify measurement type (DC, RF, Kelvin), connector requirements, and any special mechanical constraints.

Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.

Contact Form

×
Quote Request

© AIMRSE. All Rights Reserved.