Test Consumables
| Cat | Products Name | Product Highlights | Price |
|---|---|---|---|
| AIMRSE-C-TC-1 | High-Speed Coaxial Test Socket | 80GHz Test Socket | Request a Quote |
| AIMRSE-C-TC-2 | High Current Test Socket | High Current Test Socket | Request a Quote |
| AIMRSE-C-TC-3 | RF High-Speed Test Socket | 5G RF Test Socket | Request a Quote |
| AIMRSE-C-TC-4 | Wafer-Level Chip Scale Package Probe Head | WLCSP Probe Head | Request a Quote |
| AIMRSE-C-TC-5 | Memory Test Socket | Memory Test Socket | Request a Quote |
| AIMRSE-C-TC-6 | Standard Spring Probe Test Socket - BGA | BGA Spring Probe Socket | Request a Quote |
| AIMRSE-C-TC-7 | Standard Spring Probe Test Socket - LGA | LGA Spring Probe Socket | Request a Quote |
| AIMRSE-C-TC-8 | Standard Spring Probe Test Socket - QFN | QFN Spring Probe Socket | Request a Quote |
| AIMRSE-C-TC-9 | Standard Spring Probe Test Socket - QFP | QFP Spring Probe Socket | Request a Quote |
| AIMRSE-C-TC-10 | Manual Test Lid - Clamshell | Clamshell Manual Test Lid | Request a Quote |
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
Contact Form
