Test Consumables
| Cat | Products Name | Product Highlights | Price |
|---|---|---|---|
| AIMRSE-C-TC-21 | 4-Inch Heated Chuck | 4-Inch Heated Chuck | Request a Quote |
| AIMRSE-C-TC-22 | High-Temperature PID Controller | High-Temp PID Controller | Request a Quote |
| AIMRSE-C-TC-23 | High/Low-Temperature PID Controller | High/Low-Temp PID Controller | Request a Quote |
| AIMRSE-C-TC-24 | Manual Vacuum Chuck | Manual Vacuum Chuck | Request a Quote |
| AIMRSE-C-TC-25 | Temperature-Controlled Vacuum Chuck | Temp Controlled Vacuum Chuck | Request a Quote |
| AIMRSE-C-TC-26 | Semiconductor IV Test System | Semiconductor IV Test System | Request a Quote |
| AIMRSE-C-TC-27 | High-Speed Test Socket - Gen V | >84GHz High-Speed Socket | Request a Quote |
| AIMRSE-C-TC-28 | Burn-In Test Socket - C Series | C Series H-Pin Burn-In | Request a Quote |
| AIMRSE-C-TC-29 | High-Speed Test Socket - DaVinci 112 | >40GHz DaVinci Socket | Request a Quote |
| AIMRSE-C-TC-30 | Micro Test Socket - DaVinci Series | ≥0.35mm Micro Socket | Request a Quote |
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
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