Test Consumables

Q: What is the difference between a calibration substrate and an ISS?

Calibration substrate for DC/low-frequency verification; ISS for on-wafer RF VNA calibration.

Q: How often should I calibrate my probe station?

Daily verification recommended; RF recalibration at start of each session or when cables are moved.

Q: How do I clean my probe tips?

Touch tip to cleaning pad 5-10 times in same motion as landing on a device pad.

Q: Are your ISS substrates compatible with my VNA?

Yes, coefficient files compatible with Keysight, R&S, and Anritsu VNA calibration routines.

Q: How should I store my calibration substrates?

Store in clean, dry environment in ESD case; handle by edges only.

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Cat	Products Name	Product Highlights	Price
AIMRSE-C-TC-21	4-Inch Heated Chuck	4-Inch Heated Chuck	Request a Quote
AIMRSE-C-TC-22	High-Temperature PID Controller	High-Temp PID Controller	Request a Quote
AIMRSE-C-TC-23	High/Low-Temperature PID Controller	High/Low-Temp PID Controller	Request a Quote
AIMRSE-C-TC-24	Manual Vacuum Chuck	Manual Vacuum Chuck	Request a Quote
AIMRSE-C-TC-25	Temperature-Controlled Vacuum Chuck	Temp Controlled Vacuum Chuck	Request a Quote
AIMRSE-C-TC-26	Semiconductor IV Test System	Semiconductor IV Test System	Request a Quote
AIMRSE-C-TC-27	High-Speed Test Socket - Gen V	>84GHz High-Speed Socket	Request a Quote
AIMRSE-C-TC-28	Burn-In Test Socket - C Series	C Series H-Pin Burn-In	Request a Quote
AIMRSE-C-TC-29	High-Speed Test Socket - DaVinci 112	>40GHz DaVinci Socket	Request a Quote
AIMRSE-C-TC-30	Micro Test Socket - DaVinci Series	≥0.35mm Micro Socket	Request a Quote

Overview

Essential Accessories for Accurate, Repeatable Measurements: Beyond probes and cables, a complete probing setup requires calibration standards, cleaning materials, and auxiliary consumables to maintain measurement integrity. At AIMRSE, we supply Test Consumables including NIST‑traceable calibration substrates, impedance standard substrates (ISS) for RF calibration, contact cleaning pads, and wafer handling tools. These essential accessories ensure that your probe station delivers accurate, repeatable results every time you land a probe.

Calibration & Maintenance Essentials

Calibration substrates, ISS standards, and cleaning pads Fig 1: AIMRSE test consumables including NIST‑traceable calibration substrates and contact cleaning materials.

AIMRSE test consumables are selected to support the full lifecycle of your probing operations. Our NIST‑traceable calibration substrates provide precisely defined electrical standards for verifying instrument accuracy and probe station performance. Impedance standard substrates (ISS) with thru, reflect, and line structures enable accurate on‑wafer VNA calibration up to 110 GHz. Contact cleaning pads remove oxide and debris from probe tips, restoring low contact resistance and extending tip life. Wafer handling tools, including vacuum wands and tweezers, allow safe manipulation of fragile wafers and die. Our consumables are essential for daily instrument verification, on‑wafer RF calibration, probe tip maintenance and cleaning, and wafer and die handling.

Available Test Consumable Configurations

Calibration Substrates

NIST‑Traceable Resistance & Capacitance Standards
Precision thin‑film resistors and capacitors on ceramic substrates. Ideal for verifying SMU and LCR meter accuracy and probe station leakage performance.

Impedance Standard Substrates (ISS)

Thru‑Reflect‑Line (TRL) & SOLT Standards
On‑wafer calibration standards for VNA measurements up to 110 GHz. Available in coplanar waveguide (CPW) and microstrip formats.

Contact Cleaning Pads

Remove Oxide & Debris from Probe Tips
Abrasive pads for cleaning tungsten and BeCu tips. Restores low contact resistance and prevents pad damage from contaminated tips.

Wafer Handling Tools

Vacuum Wands, Tweezers, and Storage Containers
ESD‑safe tools for safe manipulation of wafers, die, and calibration substrates. Prevents contamination and physical damage.

Core Engineering Advantages

NIST‑Traceable Accuracy

All calibration substrates include a certificate of calibration traceable to NIST, ensuring that your measurements are anchored to recognized national standards.

Broadband RF Calibration

ISS substrates are characterized to 110 GHz with known S‑parameters for thru, reflect, and line standards. Compatible with Keysight, R&S, and Anritsu VNA calibration software.

ESD‑Safe Packaging & Handling

All consumables are packaged in ESD‑protective materials and shipped with handling instructions to prevent damage during transit and storage.

Test Consumables FAQ

What is the difference between a calibration substrate and an ISS?

A calibration substrate contains discrete resistors and capacitors for DC/low‑frequency verification. An ISS (Impedance Standard Substrate) contains precision transmission line structures for on‑wafer RF VNA calibration.

How often should I calibrate my probe station?

For critical measurements, verify performance daily using a calibration substrate. For RF measurements, recalibrate whenever cables are moved or temperature changes significantly, or at least at the start of each measurement session.

How do I clean my probe tips?

Gently touch the tip to the contact cleaning pad 5–10 times using the same motion as landing on a pad. This removes oxide and debris without damaging the tip geometry.

Are your ISS substrates compatible with my VNA?

Yes. Our ISS substrates include calibration coefficient files compatible with Keysight (IC‑CAP, ADS), Rohde & Schwarz, and Anritsu VNA calibration routines. Custom coefficient files can be provided upon request.

How should I store my calibration substrates?

Store in a clean, dry environment in the provided ESD‑protective case. Avoid touching the contact pads with bare fingers; handle by edges only. Periodically inspect for scratches or contamination.

Custom Consumables & Calibration Services

Need Calibration Standards or Consumables?

From standard ISS substrates to custom calibration structures for your specific device layout, our team can supply the consumables you need to keep your probe station operating at peak performance.

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Please specify substrate type, frequency range, calibration method (SOLT/TRL), and any custom requirements.

Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.

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