Semiconductor IV Test System
Catalog NO.: AIMRSE-C-TC-26
A complete DC I-V testing system for semiconductor device characterization. It integrates a high-precision probe station with low leakage current, sourceMeters, and comprehensive IV software for measuring and analyzing parameters of diodes, BJTs, and MOSFETs.
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| Product Highlights | Semiconductor IV Test System |
| Contact Resistance | 100 fA (Leakage) |
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