Burn-In Test Socket - C Series
Catalog NO.: AIMRSE-C-TC-28
Burn-in test socket family utilizing H-Pin contact technology, designed for reliability testing. It offers market-leading electrical performance within a modular design framework that provides significant flexibility and a complete solution without compromising performance.
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| Product Highlights | C Series H-Pin Burn-In |
| Pitch (mm) | ≥0.35 |
| Package Types Supported | LCC, QFP, QFN, LGA, BGA, WLCSP |
| Operating Temperature (°C) | >200 |
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