Test Consumables
| Cat | Products Name | Product Highlights | Price |
|---|---|---|---|
| AIMRSE-C-TC-41 | Test Socket - Q Series | Q Series H-Pin Socket | Request a Quote |
| AIMRSE-C-TC-42 | Test Socket - R Series | Auto IC Handling Socket | Request a Quote |
| AIMRSE-C-TC-43 | Probe Head - Volta Series | Fine-Pitch Wafer Probe Head | Request a Quote |
| AIMRSE-C-TC-44 | Tri-Temperature Test Facility | Tri-Temperature Test System | Request a Quote |
| AIMRSE-C-TC-45 | Stacked Package Test Solution - Euclid | Stacked Package Test Solution | Request a Quote |
| AIMRSE-C-TC-46 | Thermal Management Test Lid | Liquid Cooled Thermal Test Lid | Request a Quote |
| AIMRSE-C-TC-47 | Array Package Test Socket | Floating Nest Array Test Socket | Request a Quote |
| AIMRSE-C-TC-48 | High-Speed Array Socket - DaVinci Series | 50Ω High-Speed Test Socket | Request a Quote |
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
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