1A Semiconductor Test Probe 13.1GHz, 1.24nH
Catalog NO.: AIMRSE-C-PT-82
This semiconductor test probe offers a rated current of 1 Amp, a bandwidth of -1 dB at 13.1 GHz, an inductance of 1.24 nH, and a capacitance of 1.68 pF. It is ideal for use in communication power electronics, semiconductor wafer testing, and chip packaging, providing low contact resistance and high bandwidth for 5-40G high-frequency signal testing.
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| Product Highlights | 1A 13.1GHz Test Probe |
| Current Rating | 1 Amps |
| Bandwidth / Data Rate | -1 dB@13.1 GHz |
| Barrel (Materials & Plated) | Ph/SP, Au on Ni Plated |
| Plunger 1 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Plunger 2 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Spring (Materials & Plated) | SWP/SUS, Au on Ni Plated |
| Inductance | 1.24 nH |
| Capacitance | 1.68 pF |
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