2A Low-Frequency Test Probe 2.9GHz, 1.51nH
Catalog NO.: AIMRSE-C-PT-88
This low-frequency test probe offers a rated current of 2 Amps, a bandwidth of -1 dB at 2.9 GHz, an inductance of 1.51 nH, and a capacitance of 1.98 pF. It is ideal for use in communication power electronics, semiconductor wafers, and chip packaging, delivering low contact resistance and high bandwidth for 5-40G high-frequency signal testing.
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| Product Highlights | 2A 2.9GHz Low‑Frequency Probe |
| Current Rating | 2 Amps |
| Bandwidth / Data Rate | -1 dB@2.9 GHz |
| Barrel (Materials & Plated) | Ph/SP, Au on Ni Plated |
| Plunger 1 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Plunger 2 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Spring (Materials & Plated) | SWP/SUS, Au on Ni Plated |
| Inductance | 1.51 nH |
| Capacitance | 1.98 pF |
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