2A Test Probe 7.5GHz, 1.46nH

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Catalog NO.: AIMRSE-C-PT-84

2A Test Probe 7.5GHz, 1.46nH

This test probe provides a rated current of 2 Amps, a bandwidth of -1 dB at 7.5 GHz, an inductance of 1.46 nH, and a capacitance of 2.00 pF. It is used in communication power electronics, semiconductor wafer testing, and chip packaging, delivering low contact resistance and high bandwidth for 5-40G high-frequency signal testing.

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Product Highlights 2A 7.5GHz Test Probe
Current Rating 2 Amps
Bandwidth / Data Rate -1 dB@7.5 GHz
Barrel (Materials & Plated) Ph, Au on Ni Plated
Plunger 1 (Materials & Plated) SK4/Becu, Au on Ni Plated; PD, No Plated
Plunger 2 (Materials & Plated) SK4/Becu, Au on Ni Plated; PD, No Plated
Spring (Materials & Plated) SWP/SUS, Au on Ni Plated
Inductance 1.46 nH
Capacitance 2.00 pF

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