3A Low-Frequency Test Probe 2.9GHz, 1.55nH
Catalog NO.: AIMRSE-C-PT-116
This low-frequency test probe has a rated current of 3 Amps, a bandwidth of -1 dB at 2.9 GHz, an inductance of 1.55 nH, and a capacitance of 1.92 pF. It is suitable for communication power electronics, semiconductor wafer testing, and chip packaging, providing low contact resistance and high bandwidth for 5-40G high-frequency signal testing.
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| Product Highlights | 3A 2.9GHz Low‑Frequency Probe |
| Current Rating | 3 Amps |
| Bandwidth / Data Rate | -1 dB@2.9 GHz |
| Barrel (Materials & Plated) | Ph, Au on Ni Plated |
| Plunger 1 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Plunger 2 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Spring (Materials & Plated) | SWP/SUS, Au on Ni Plated |
| Inductance | 1.55 nH |
| Capacitance | 1.92 pF |
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