5A Low-Frequency Test Probe 2.9GHz, 1.50nH

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Catalog NO.: AIMRSE-C-PT-160

5A Low-Frequency Test Probe 2.9GHz, 1.50nH

This low-frequency test probe offers a rated current of 5 Amps, a bandwidth of -1 dB at 2.9 GHz, an inductance of 1.50 nH, and a capacitance of 1.70 pF. It is suitable for use in communication power electronics, semiconductor wafers, and chip packaging, delivering low contact resistance and high bandwidth for 5-40G high-frequency signal testing.

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Product Highlights 5A Low-Frequency 2.9GHz Probe
Current Rating 5 Amps
Bandwidth / Data Rate -1 dB@2.9 GHz
Barrel (Materials & Plated) Ph, Au on Ni Plated
Plunger 1 (Materials & Plated) SK4/Becu, Au on Ni Plated; PD, No Plated
Plunger 2 (Materials & Plated) SK4/Becu, Au on Ni Plated; PD, No Plated
Spring (Materials & Plated) SWP/SUS, Au on Ni Plated
Inductance 1.50 nH
Capacitance 1.70 pF

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