Angled Tungsten Steel Probe Needle
Catalog NO.: AIMRSE-C-PT-25-4
Applications
R/F, I/O, DC, wafer, solar cell, photocurrent testing
This angled tungsten steel probe needle is designed for probing applications requiring access at a specific angle. It maintains the high conductivity and durability of tungsten steel. Suitable for R/F measurement, I/O point measurement, DC testing, and wafer probing. Current range is 1fA-4A. Available tip diameters: 1, 3, 5, 10, 30, 50, 150, 300, 500µm.
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| Product Highlights | Beryllium copper probe needle |
| Features | Angled design for鐗规畩 access |
| Material | Tungsten Steel |
| Tip Material | Tungsten Steel |
| Probe Type | Needle |
| Tip Diameter / Radius | 1/3/5/10/30/50/150/300/500 µm |
| Tip Configuration | Angled Single Point |
| Length | 32 mm |
| Frequency Range | DC |
| Compatible With | Standard probe holders |
| Current Rating | 1 fA - 4 A |
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