Burn-In Test Socket - D Series
Catalog NO.: AIMRSE-C-TC-31
Burn-in test socket family utilizing H-Pin technology, designed for high-reliability applications. It supports a wide variety of package types and incorporates features for thermal management and harsh environment testing.
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| Product Highlights | D Series H-Pin Burn-In |
| Package Types Supported | QFN, QFP, LCC, SOIC, BGA, LGA |
| Operating Temperature (°C) | >200 |
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