CF Plan DI EPI
Catalog NO.: AIMRSE-PC-MS-6
Applications
Surface topography measurement; Geometric feature characterization; Non-contact profilometry
A white light interference objective with an infinity-corrected design and a 60mm parfocal distance. Specifically intended for non-contact measurement applications to analyze surface topography and geometric characteristics.
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| Product Highlights | White-light metrology |
| Key Features / Applications | Designed for non-contact surface measurement; |
| Series / Type | CF Plan DI EPI |
| Optical Specifications | Infinity-corrected |
| Parfocal Distance | 60mm |
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