CF Plan TI/DI
Catalog NO.: AIMRSE-PC-MS-5
Applications
Surface topography measurement; Geometric feature characterization; Non-contact profilometry
A white light interference objective optimized for non-contact surface measurement. Features an infinity-corrected optical design with a 45mm parfocal distance. Ideal for characterizing surface topography and geometric features.
X
X
| Product Highlights | White-light interference |
| Key Features / Applications | Designed for non-contact surface measurement; |
| Series / Type | CF Plan TI/DI |
| Optical Specifications | Infinity-corrected |
| Parfocal Distance | 45mm |
Contact Form
