Compact Probe Station P-150
Catalog NO.: AIMRSE-PS-S-2
Designed for I-V/C-V, LIV optoelectronic testing, 1/f noise testing, and RF S-parameter measurements. The entire system occupies minimal space with flexible and simple operation. Meets demanding test requirements, making it an excellent choice for small laboratories and R&D. Compatible with source meters, semiconductor parameter analyzers, LCR meters, and network analyzers.
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| Product Highlights | 6-inch compact probing |
| Chuck Size | 6 inches standard; 4 inches optional |
| Temperature Range | Ambient standard; Optional: 100°C/200°C/300°C/400°C |
| Microscope / Optics | Monocular microscope standard (30X~150X); Stereo microscope optional; Focus range: 0-30mm; LED light standard, Coaxial/Cold light optional |
| Manipulator / Probe | MP-150 probe holders standard (MP-180/200 optional); 2 probe positions standard (2-6 optional); Probe precision: ±0.7μm standard (±0.5/0.35μm optional) |
| Positioning Precision | ±0.7μm standard |
| Imaging System | HD 1080P industrial camera standard (photo/video/measurement) |
| Fixture Type | Coaxial probe fixture standard; RF probe arm optional; Imported triaxial probe fixture optional; BNC connector standard; SMA/3.5mm/2.92mm/2.4mm/1.0mm/Triaxial/Banana plug optional |
| Weight | Approx. 30-55KG |
| Dimensions | 520×400×500mm |
| RF Frequency Support | DC~1MHz/100MHz/1GHz/40GHz/50GHz/67GHz/110GHz optional |
| Chuck X/Y Travel | 75×65mm standard; 25×25mm optional |
| Features | Coaxial knob control stage movement standard; Differential head control optional; Vacuum adsorption with 3 independent valves; Chuck material: Aluminum standard, Ceramic/PTFE/Gold-plated optional; Probe tip diameter: 0.5-100μm optional |
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