DG Series Photocurrent Probe Station
Catalog NO.: AIMRSE-PS-S-13
Primarily used in semiconductor, optoelectronic, IC, and packaging testing. Widely applied in R&D of precise electrical measurements for complex, high-speed devices. This custom probe station can be used with a photocurrent microscope and allows different wavelength light injection for testing device electrical characteristics under specific wavelengths and energy.
X
X
| Product Highlights | Photocurrent measurement test |
| Temperature Range | Ambient (can be integrated with high-low temperature systems) |
| Microscope / Optics | Built on metallurgical microscope with introduced light path; Dual/three light paths (one introduction, 1-2 imaging); Introduction light: parallel laser/linear light, 200-20000nm, 360° polarization adjustment; Imaging: coaxial metallurgical, 1× and 0.25-10× paths |
| Features | Optical time switch for irradiation control (1ms precision, 2ms-∞); All modules removable; 650nm red light spot indication; Can be used for photocurrent scanning imaging |
Contact Form
