DM Series Basic Probe Station
Catalog NO.: AIMRSE-PS-S-10
Designed for basic wafer testing in university education and small laboratory research. Compact structure, precision design, affordable price, and flexible configuration. Compatible with instruments for IV/CV, I-t/V-t, optoelectronic, 1/f noise, device characterization, and RF testing. Recommended for devices with pad electrodes >50μm.
X
X
| Product Highlights | Basic educational probing |
| Chuck Size | 4, 6, 8 inches (316 stainless steel, gold-plated) |
| Temperature Range | Ambient |
| Microscope / Optics | Compatible with stereo and video microscopes; CCD imaging system with photo/video/scale functions |
| Manipulator / Probe | DC or RF probe holders optional (0.5/0.7/1μm precision) |
| Positioning Precision | Probe: 0.5μm, 0.7μm, 1μm optional |
| Imaging System | CCD imaging system |
| Fixture Type | Triaxial (100fA) / Coaxial (10pA) |
| Chuck X/Y Travel | Matched to chuck size |
| Features | Integrated design, compact footprint; Can be placed inside glove boxes; Adaptive damping base; U-shaped nickel-plated platform; Two back electrodes (180° design); Chuck Z: 5mm quick lift, optional 6mm fine lift (1μm); Vacuum adsorption (ring/multi-hole, independent); Anti-static grounding |
Contact Form
