Double-Sided Probe Station for PCB RF Testing

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Catalog NO.: AIMRSE-PS-RF-1

Double-Sided Probe Station for PCB RF Testing

The TS300-PCB is a large, versatile manual probe station for testing wafers up to 300mm and PCB boards up to 610x500mm. It features a specially designed probe station and large microscope movement to cover large probing areas, suitable for RF, millimeter-wave, signal integrity measurements, failure analysis, and design validation.

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Product Highlights Large PCB & RF probing
Chuck Size 300mm wafers; 610x500mm PCB boards
Microscope / Optics Large microscope movement system
Manipulator / Probe High-flexibility positioners
Imaging System Dual HD CCD imaging systems
Fixture Type Highly customizable PCB fixtures; Supports TRL, SOLT, TMRR calibration methods
Key Features / Applications Impedance and loss testing; Ultra-high frequency automotive radar; Satellite communications; High-speed optoelectronics; Signal Integrity (SI) measurement; TDR impedance testing
RF Frequency Support Up to 110GHz-325GHz

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