High-Frequency Semiconductor Test Probe 0.5A, 13.1GHz
Catalog NO.: AIMRSE-C-PT-81
This high-frequency semiconductor test probe is designed for precision testing in communication power electronics, semiconductor wafers, and chip packaging. It features a rated current of 0.5 Amps, a bandwidth of -1 dB at 13.1 GHz, an inductance of 1.23 nH, and a capacitance of 1.63 pF. The probe ensures low contact resistance and high bandwidth, meeting the requirements for 5-40G high-frequency signal testing.
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| Product Highlights | 0.5A 13.1GHz Test Probe |
| Current Rating | 0.5 Amps |
| Bandwidth / Data Rate | -1 dB@13.1 GHz |
| Barrel (Materials & Plated) | SP, Au on Ni Plated |
| Plunger 1 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Plunger 2 (Materials & Plated) | SK4/Becu, Au on Ni Plated; PD, No Plated |
| Spring (Materials & Plated) | SWP/SUS, Au on Ni Plated |
| Inductance | 1.23 nH |
| Capacitance | 1.63 pF |
Contact Form
