High-Low Temperature Semi-Automatic Probe Station
Catalog NO.: AIMRSE-PS-RF-7
This is an upgraded version of a standard probe station model, equipped with a shielded environment to achieve ultra-low noise, high-precision DC/CV, 1/f, RTS, and RF measurements. A unique actively cooled probe platen design ensures stability over a wide temperature range.
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| Product Highlights | 12-inch semi-automatic test |
| Chuck Size | 300mm (12 inches) |
| Temperature Range | -60°C to 300°C |
| Vacuum / Chamber | Shielded environment |
| Microscope / Optics | Programmable microscope stage |
| Manipulator / Probe | Actively cooled probe platen |
| Cooling Method | Actively cooled probe platen design |
| Anti-Vibration | Built-in vibration isolation system |
| Fixture Type | Shielded environment |
| Key Features / Applications | fA-level ultra-low noise IV measurements; Safety Test Management System (STM™); Automatic dew point control; Suitable for device characterization, wafer-level reliability, RF/mmW applications |
| RF Frequency Support | 26 GHz to 110 GHz and above |
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