High-Precision Probe Station (0.7 μm)

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Catalog NO.: AIMRSE-PC-M-34

High-Precision Probe Station (0.7 μm)

Product Info: Main material: aviation aluminum alloy, sandblasted oxidation. Displacement: imported crossed roller guide rails. Drive: imported high-resolution differential head (0.7 μm resolution). Holder: multi-functional (180° rotation + precision 60° directional tilt) for microscope use. Base: adjustable magnetic (10Kg). Upgradeable to vacuum (7L/min pump). Specs: Travel: 13mm XYZ + 180° rotation + precision 60° tilt (lockable). Size: 300×82×120mm. Precision: 0.7 μm. Leakage: Coaxial (10pA), imported triaxial (100fA). Connectors: Coaxial (BNC, clip, banana, N-type, SMA), Triaxial (Triaxial). Range: Current 10pA/100fA-10A, Voltage ≤1000V Application: RF, I/O, DC, wafer, resistor, solar, photocurrent, semiconductor testing.

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Product Highlights 0.7μm High Precision Probe
Drive Mechanism Imported high-resolution differential head (0.7 μm)
Mounting Type Magnetic adsorption (10Kg), Optional vacuum
Material Aviation aluminum alloy, sandblasted oxidation
Leakage Current Coaxial cable (10pA), Imported triaxial cable (100fA)
Movement Accuracy 0.7 μm
Adjustment Dimensions 13mm XYZ + 180° rotation + precision 60° tilt (lockable)
X-Y-Z Stroke 300mm×82mm×120mm
Fixing Force 10Kg (magnetic)
Guide Rail Type Imported crossed roller guide rails
Probe Holder Type Multi-functional (180° rotation + precision 60° directional tilt, lockable)
Connector Options Coaxial: BNC, alligator clip, banana plug, N-type, SMA; Triaxial: Triaxial interface
Current Measurement Range 10pA/100fA - 10A
Voltage Measurement Range ≤1000V
Resolution 0.7 μm
Application Areas Suitable for RF, I/O, DC, wafer, resistor, solar, photocurrent, semiconductor testing.
Guide Type Crossed roller
Differential Head Yes, 0.7 μm resolution

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