L-Type Probe Station 10 μm

As a core component of a probe station, the probe station is mainly used to connect probes and cables, providing a conduction condition for electrical parameter testing of semiconductor chips. It can be distinguished by adjustment accuracy (10 μm/5 μm/3 μm/1 μm/0.5 μm, etc.), operation mode (manual/electric), and application scenario (universal/universal/L-type, etc.). Widely used in electrical parameter testing in semiconductor and optoelectronics industries. Technical Advantages: Main body: imported aviation aluminum, good stability/linear precision. Displacement: precision dovetail groove (split type). Drive: handwheel with double top screw. Holder: L-shaped, 45° fixed angle, high linearity. Probe: spring lock, compatible with probes under 0.5mm. Base: adjustable magnetic (5Kg).