Large DC Probe Card (21-1000 Pins)
Catalog NO.: AIMRSE-C-PT-40
DC probing of ICs and micro-devices with up to 1000 pins
This large DC probe card supports 21 to 1000 pins for probing integrated circuits and micro-devices. It offers extensive customization including probe material (Rhenium-Tungsten or Beryllium Copper), tip diameter (25+2µm typical), probe shank diameter (150µm typical), tip-to-tip pitch, and probe-to-substrate height. Construction uses H9 epoxy with an optional bypass capacitor. Probes are arranged in a straight line pattern.
| Product Highlights | 3A high-current IC probe |
| Features | Highly customizable, H9 epoxy, optional bypass capacitor, high pin count |
| Material | ReW / BeCu (customizable) |
| Tip Material | ReW or BeCu |
| Probe Type | Probe Card |
| Shank Diameter | 150 µm (typical, customizable) |
| Tip Diameter / Radius | 25+2 µm (typical, customizable) |
| Tip Configuration | Multi-pin straight |
| Length | Customizable |
| Frequency Range | DC |
| Compatible With | Custom probe station setup |
| Pitch Range | Customizable |
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