Manual Probe Station for DC/RF Wafer-Level Testing
Catalog NO.: AIMRSE-PS-RF-5
This 12-inch manual probe station is designed for EMI/RFI/Light-Tight shielding, providing ultra-low noise and low leakage measurement capabilities. The temperature measurement range is -60°C to 300°C, suitable for device characterization, RF/millimeter-wave, wafer-level reliability, and failure analysis.
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| Product Highlights | 12-inch low-leakage test |
| Chuck Size | 300mm (12 inches) |
| Temperature Range | -60°C to 300°C |
| Vacuum / Chamber | Shielded environment |
| Microscope / Optics | Various optical microscopes available |
| Manipulator / Probe | DC/RF/mmW micro-positioners |
| Cooling Method | Supports high-temperature modules |
| Anti-Vibration | Built-in vibration isolation system |
| Fixture Type | Shielded environment |
| Key Features / Applications | Femtoamp-level low leakage measurements; Quick-release air-bearing stage design; EMI/RFI shielding |
| RF Frequency Support | Supports RF and millimeter-wave |
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