Medium-Large 8-inch Double-Sided Probe Station T-200D
Catalog NO.: AIMRSE-PS-S-6
Designed for double-sided probing, supporting 1-8 inch wafers, single devices, modules, and PCB testing. Suitable for I/V curve testing, C/V testing, and RF S-parameter measurements. Features high stability and ease of use. Ideal for laboratory chip verification, failure analysis, and RF chip S-parameter testing. Compatible with source meters, semiconductor parameter analyzers, LCR meters, and network analyzers.
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| Product Highlights | 8-inch double-sided test |
| Chuck Size | 8 inches (203mm) hollow chuck standard; 203×203mm square optional |
| Temperature Range | Ambient standard |
| Microscope / Optics | Top microscope: Stereo standard (8X~50X), Monocular optional (30X~150X), Metallurgical optional (50X~1000X); Bottom microscope: Monocular standard (30X~150X); Focus range: 0-30mm; LED light standard, Coaxial/Cold light optional |
| Manipulator / Probe | MP-150 probe holders standard (MP-180/200 optional); 4 probe positions standard (2-10 optional); Probe precision: ±0.7μm standard (±0.5/0.35μm optional) |
| Positioning Precision | ±0.7μm standard |
| Imaging System | Bottom microscope HD 1080P industrial camera standard (photo/video/measurement) |
| Fixture Type | Coaxial probe fixture standard; RF probe arm optional; Imported triaxial probe fixture optional; BNC connector standard |
| Weight | Approx. 75-95KG |
| Dimensions | 670×745×700mm |
| RF Frequency Support | SMA/3.5mm/2.92mm/2.4mm/1.0mm/Triaxial/Banana plug optional; DC~1MHz/100MHz/1GHz/40GHz/50GHz/67GHz/110GHz optional |
| Chuck X/Y Travel | 8"×8" (203×203mm) standard; 50×50mm optional |
| Features | Hollow chuck design for double-sided probing; Fine lead screw displacement with handle control; Vacuum adsorption with adsorption slots; Chuck rotation fine adjustable; Chuck Z-lift: 0-10mm; Chuck material: Aluminum standard, PTFE/Gold-plated optional |
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