Medium-Large High Voltage / High Current Probe Station T-V8
Catalog NO.: AIMRSE-PS-H-1
Designed for electrical performance testing of 1-6" wafers, batch devices, and single chips. Suitable for transistor (bipolar, FET) testing. Features maximum 10kV application with safety interlock function. Ideal for laboratory chip verification, research, and production line power chip testing. Compatible with source meters, semiconductor parameter analyzers, TLP, and specialized high voltage testers.
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| Product Highlights | 8-inch high-voltage test |
| Chuck Size | 8 inches (203mm) standard |
| Temperature Range | Ambient standard; Optional: 100°C/200°C/300°C/400°C |
| Microscope / Optics | Stereo microscope standard (8X~50X); Monocular optional (30X~150X); Metallurgical optional (50X~1000X); Focus range: 0-30mm; LED light standard |
| Manipulator / Probe | MP-150 probe holders standard (MP-180/200 optional); 3 probe positions standard (2-8 optional); Probe precision: ±0.7μm standard (±0.5/0.35μm optional) |
| Positioning Precision | ±0.7μm standard |
| Imaging System | HD 1080P industrial camera optional (photo/video/measurement) |
| Fixture Type | High voltage coaxial probe fixture standard; Imported triaxial probe fixture optional; Triaxial/Banana connectors optional |
| Voltage / Current Range | Voltage: 3kV standard, 5kV optional; Current: 0-300A (pulse current default) |
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