MEMS Probe Card
Catalog NO.: AIMRSE-C-TC-18
Probe card utilizing MEMS technology, primarily applied in the testing of advanced process wafers. It offers significant advantages for testing small geometry devices, including fine pitch capabilities, high parallel test counts, and high pin counts.
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| Product Highlights | MEMS Probe Card |
| Pitch (mm) | ≥0.045 |
| Operating Temperature (°C) | -55 to +175 |
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