Microscope Systems
| Cat | Products Name | Product Highlights | Price |
|---|---|---|---|
| AIMRSE-PC-MS-11 | Plan Fluor EPI BD | Brightfield/darkfield objective | Request a Quote |
| AIMRSE-PC-MS-12 | Plan Fluor EPI | High-contrast objective | Request a Quote |
| AIMRSE-PC-MS-13 | Plan Fluor EPI BD | BD 60mm objective | Request a Quote |
| AIMRSE-PC-MS-14 | Plan Fluor EPI | EPI 60mm objective | Request a Quote |
| AIMRSE-PC-MS-15 | Plan Apo EPI | Long-working objective | Request a Quote |
| AIMRSE-PC-MS-16 | L Plan Fluor EPI BD | LWD BD objective | Request a Quote |
| AIMRSE-PC-MS-17 | L Plan Fluor EPI | LWD brightfield | Request a Quote |
| AIMRSE-PC-MS-18 | CF Plan | Achromatic flat-field | Request a Quote |
Overview
Optical Design & Probe Station Integration
Fig 1: AIMRSE microscope system configured for probe station visualization and documentation.
AIMRSE microscope systems are built around precision stereo‑zoom optics with magnification ranges from 0.7× to 4.5× zoom and total magnification up to 200× with appropriate objectives and eyepieces. Long‑working‑distance objectives provide ample clearance for probe arms and positioners, while coaxial epi‑illumination ensures uniform lighting on reflective wafer surfaces. A sturdy boom stand with 360° rotation and fine‑focus adjustment allows the microscope to be positioned optimally over the sample. HD digital camera integration enables live image viewing on a monitor and capture of high‑resolution still images for documentation and failure analysis reports. Our microscope systems are trusted for wafer inspection and alignment, probe tip placement verification, failure analysis documentation, and photon emission and electroluminescence imaging.
Available Microscope Configurations
Stereo‑Zoom Microscopes
0.7×–4.5× Zoom, Up to 45× Total Magnification
Wide field of view for wafer navigation and probe placement. Ideal for routine DC and RF probing with 1 µm to 10 µm feature sizes.
High‑Magnification Systems
Up to 200× Total Magnification
Additional objective lenses and high‑power eyepieces for viewing sub‑micron gate structures. Essential for advanced semiconductor nodes and failure analysis.
HD Digital Camera Integration
1080p/4K Live View and Image Capture
USB 3.0 or HDMI cameras with measurement software. Eliminates eyestrain and enables collaborative viewing on large monitors.
Specialty Illumination Options
Coaxial, Ring Light, and Oblique Illumination
Tailored lighting for specific sample types, including highly reflective metal pads, transparent substrates, and rough surfaces.
Core Engineering Advantages
Long Working Distance Optics
Objectives with working distances up to 100 mm provide ample clearance for probe arms, positioners, and RF probe bodies. This allows the microscope to be positioned for optimal viewing without interfering with the measurement setup.
Coaxial Epi‑Illumination
Light is directed through the microscope objective, providing uniform, shadow‑free illumination perpendicular to the wafer surface. This is essential for viewing features on highly reflective metal pads and for critical dimension measurements.
Vibration‑Isolated Mounting
The boom stand includes a rigid post and adjustable arm with locking mechanisms. For sensitive applications, the stand can be mounted on the same vibration‑isolation platform as the probe station, ensuring that the microscope image remains stable.
Microscope System FAQ
What magnification do I need for my application?
Can I add a camera to an existing microscope?
What is the advantage of coaxial illumination?
Is the microscope compatible with vacuum or cryogenic chambers?
Can I use the microscope for photonic or electroluminescence imaging?
Custom Microscope Engineering Services
Ready to Configure Your Microscope System?
From magnification requirements and working distance to camera integration and specialized illumination, our team will specify a microscope system that provides the clarity and documentation capabilities your laboratory demands.
Please specify required magnification range, working distance, camera needs, and any vacuum or cryogenic compatibility requirements.
Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.
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