Ni Alloy Spring Contact Probe - 0.05mm 25gf 0.40mm Stroke 400k Cycle

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Catalog NO.: AIMRSE-C-PT-168

Ni Alloy Spring Contact Probe - 0.05mm 25gf 0.40mm Stroke 400k Cycle

This high-precision spring contact probe combines compact structure with excellent electrical performance. The 0.05mm thin profile fits narrow-pitch layouts, while 25gf force ensures reliable contact without damaging pads. Widely used in semiconductor testing, camera modules, fingerprint modules and precision connectors.

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Product Highlights 0.05mm High-Precision Probe
Material Nickel Alloy
Contact Resistance 80 mΩ
Thickness 0.05 mm
Stroke 0.40 mm
Contact Force 25 gf
Rated Current 1.5 A
Life Cycle 400k cycles
Application Semiconductor, Camera Module, Fingerprint Module

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