Optoelectronic Probe Station G-150
Catalog NO.: AIMRSE-PS-S-3
Designed for optoelectronic performance testing of devices, chips, and MEMS. Supports multiple application modes: vertical angle, horizontal angle, tilt angle coupling/receiving. Highly integrated with high stability. Ideal for optoelectronic chip testing (optoelectronic converters, MicroLED/VCSEL, etc.). Compatible with laser sources, optical power meters, spectrometers, and precision power supplies.
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| Product Highlights | Optoelectronic performance test |
| Chuck Size | Standard: 90×90mm (customizable) |
| Temperature Range | Ambient standard; Optional: -100°C/200°C/300°C/400°C |
| Microscope / Optics | Top microscope: Monocular standard (30X~150X), Stereo optional; Side microscope: Monocular optional (30X~150X); Side microscope position adjustment: X/Y 25×25mm, pitch ±15°; Focus range: 0-30mm; LED light standard, Coaxial/Cold light optional |
| Manipulator / Probe | MP-150 probe holders standard (MP-180/200 optional); 1-3 probe positions optional; 5-axis fiber optic coupling stage (compatible with single/multi-mode fiber); Probe precision: ±0.7μm standard (±0.5/0.35μm optional) |
| Positioning Precision | ±0.7μm standard |
| Imaging System | HD 1080P industrial camera standard (photo/video/measurement) |
| Fixture Type | Coaxial probe fixture standard; RF probe arm optional; Imported triaxial probe fixture optional; BNC connector standard |
| Weight | Approx. 30-55KG |
| Dimensions | 500×410×530mm |
| RF Frequency Support | SMA/3.5mm/2.92mm/2.4mm/1.0mm/Triaxial/Banana plug optional |
| Chuck X/Y Travel | Standard: 25×25mm (fine adjustment); Slide rail travel: 45mm |
| Features | Horizontal coupling / Vertical coupling / Tilt angle coupling; Differential head fine control; Vacuum adsorption with adsorption slots; Chuck rotation fine adjustable; Chuck Z-lift: 0-10mm; Probe tip diameter: 0.5-100μm optional; Probe material: Tungsten steel standard/Copper-plated optional |
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