Probe Station Model with L-shaped Holder
Catalog NO.: AIMRSE-PC-M-32
Product Info: Main body: imported aviation aluminum. Displacement: precision-machined dovetail groove (split type). Drive: handwheel with double top screw. Holder: L-shaped, 45° fixed angle, high linearity. Probe: spring lock, compatible with probes under 0.5mm. Base: adjustable magnetic (5Kg). Specs: Travel: 13mm XYZ + 360° rotation + tilt. Size: 200×45×80mm. Precision: 10 μm. Leakage: Coaxial (10pA), imported triaxial (100fA). Connectors: Coaxial (BNC, clip, banana), Triaxial (Triaxial). Range: Current 10pA/100fA-10A, Voltage ≤1000V Application: RF, I/O, DC, wafer, resistor, solar, photocurrent, semiconductor testing.
| Product Highlights | L‑shaped Fixed Probe Head |
| Drive Mechanism | Handwheel drive |
| Mounting Type | Magnetic adsorption (5Kg) |
| Material | Imported aviation aluminum |
| Leakage Current | Coaxial cable (10pA), Imported triaxial cable (100fA) |
| Movement Accuracy | 10 μm |
| Adjustment Dimensions | 13mm XYZ + 360° rotation + tilt |
| X-Y-Z Stroke | 200mm×45mm×80mm |
| Guide Rail Type | Dovetail groove |
| Probe Holder Type | L-shaped, 45° fixed angle, spring lock |
| Compatible Probe Diameter | <0.5mm |
| Connector Options | Coaxial: BNC, alligator clip, banana plug; Triaxial: Triaxial interface |
| Current Measurement Range | 10pA/100fA - 10A |
| Voltage Measurement Range | ≤1000V |
| Application Areas | Suitable for RF, I/O, DC, wafer, resistor, solar, photocurrent, semiconductor testing. |
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