Semi-Automatic Probe Station for RF/DC Wafer-Level Testing
Catalog NO.: AIMRSE-PS-RF-10
This 300mm semi-automatic probe station is functionally equivalent to standard 300mm probe station models. Upgrading with a wafer loading system adds fully automatic capabilities. It incorporates advanced technologies like probe head control, motorized drives, and vision control elements.
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| Product Highlights | 300mm semi-automatic test |
| Chuck Size | 300mm (12 inches) |
| Temperature Range | -60°C to +300°C (with Ice-free Environment technology) |
| Vacuum / Chamber | Shielded environment |
| Manipulator / Probe | Micro-positioners and probe cards; Advanced cantilever technology supports multiple probe cards |
| Cooling Method | Ice-free Environment™ Technology |
| Anti-Vibration | Active vibration isolation |
| Fixture Type | Shielded environment |
| Key Features / Applications | Wafer loading systems (Standard/Max/Ultra); Automatic probe card changer; Advanced software suite; Off-axis Pad-to-Pad Alignment; Suitable for silicon photonics, load pull, WLR testing |
| RF Frequency Support | RF, Millimeter-wave, Terahertz |
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