Standard Tungsten Needle
Catalog NO.: AIMRSE-C-PT-1-ST
General chip electrode and circuit probing, piercing passivation layers
This standard tungsten probe needle is the most frequently used probe in semiconductor probing applications. It is made of 99.99% pure tungsten with excellent oxidation resistance. The 0.020 inch (0.51mm) diameter shank is precision electrochemically processed to create various tip diameters. The needle is 1.5 inches (38.1mm) long and can be manually bent for specific applications. It is suitable for probing chip electrodes, circuit points, and can also be used to scratch or pierce through chip surface passivation layers.
| Product Highlights | T-4 soft probe needle |
| Features | Manually bendable, excellent oxidation resistance, high frequency of use |
| Material | Tungsten (99.99%) |
| Tip Material | Tungsten |
| Probe Type | Needle |
| Shank Diameter | 0.51 mm (0.020 inch) |
| Tip Diameter / Radius | 1-200 µm |
| Tip Configuration | Single Point |
| Length | 38.1 mm (1.5 inch) |
| Frequency Range | DC |
| Compatible With | Standard triaxial probe holders |
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