Temperature-Controlled Probe Station - CPPSH Series

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Catalog NO.: AIMRSE-PS-S-27

Temperature-Controlled Probe Station - CPPSH Series

A probe station series based on the CPPSC platform, upgraded with a heated chuck for temperature-controlled measurements. It features PID temperature control for characterizing devices under high-temperature conditions without oxidation.

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Product Highlights High-Temp Anti-Oxidation Probe
Chuck Size 4, 6 inch
Temperature Range Ambient to 300°C
Key Features / Applications PID control with ±1°C accuracy; Suitable for high-temperature testing; Available for 4 and 6-inch chucks.
Leakage Current 10pA - 100fA (with shield box)
Model 1, 3, 5, 10 µm (Probe)

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