Test Socket - ES Micro Series
Catalog NO.: AIMRSE-C-TC-32
Test socket designed for LGA, BGA, and Package-on-Package (PoP) devices. It utilizes H-Pin technology and is engineered with a large component clearance area under the DUT to accommodate complex, multi-die modules.
X
X
| Product Highlights | ES Micro Series Socket |
| Package Types Supported | LGA, BGA, PoP |
| Operating Temperature (°C) | >200 |
Contact Form
