Test Socket - ESJ Series
Catalog NO.: AIMRSE-C-TC-33
Test socket utilizing H-Pin contact technology. It is designed with a maximized component clearance area underneath the Device Under Test (DUT), making it suitable for modules with bottom-side components. Built with high-temperature materials.
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| Product Highlights | ESJ Series H-Pin Socket |
| Operating Temperature (°C) | >200 |
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