Tungsten Steel Probe Needle
Catalog NO.: AIMRSE-C-PT-25-1
Applications
R/F, I/O, DC, wafer, solar cell, photocurrent testing
This tungsten steel probe needle is a core component for semiconductor electrical parameter testing. It is suitable for a wide range of applications including R/F measurement, I/O point measurement, DC testing, and wafer probing. It features杩涘彛 tungsten steel for excellent conductivity. The fine and flexible tip minimizes damage to ICs. Current range is 1fA-1A. Available tip diameters: 1, 3, 5, 10, 30, 50, 150, 300, 500µm.
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| Product Highlights | Gold-plated tungsten needle |
| Features | High conductivity, fine tip, minimizes damage |
| Material | Tungsten Steel |
| Tip Material | Tungsten Steel |
| Probe Type | Needle |
| Tip Diameter / Radius | 1/3/5/10/30/50/150/300/500 µm |
| Tip Configuration | Single Point |
| Length | 38 mm |
| Frequency Range | DC |
| Compatible With | Standard probe holders |
| Current Rating | 1 fA - 1 A |
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