Universal Probe Station 0.5 μm

As a core component of a probe station, the probe station is mainly used to connect probes and cables, providing a conduction condition for electrical parameter testing of semiconductor chips. It can be distinguished by adjustment accuracy (10 μm/5 μm/3 μm/1 μm/0.5 μm, etc.), operation mode (manual/electric), and application scenario (universal/universal/L-type, etc.). Widely used in electrical parameter testing in semiconductor and optoelectronics industries. Technical Advantages: Main body: imported aviation aluminum, sandblasted oxidation. Guide rail: imported crossed roller rails, ultra-high stability. Drive: imported high-resolution differential head (0.5 μm). Holder: multi-functional (180° rotation + 60° directional tilt). Suitable for microscope use, non-blocking. Base: adjustable magnetic (10Kg). Optional vacuum upgrade (7L/min pump).