Universal Probe Station 5 μm (Universal Holder)
Catalog NO.: AIMRSE-PC-M-42
As a core component of a probe station, the probe station is mainly used to connect probes and cables, providing a conduction condition for electrical parameter testing of semiconductor chips. It can be distinguished by adjustment accuracy (10 μm/5 μm/3 μm/1 μm/0.5 μm, etc.), operation mode (manual/electric), and application scenario (universal/universal/L-type, etc.). Widely used in electrical parameter testing in semiconductor and optoelectronics industries. Technical Advantages: Main body: imported aviation aluminum, sandblasted oxidation. Guide rail: imported crossed roller rails, good stability. Drive: imported high-resolution differential head. Holder: universal (360° rotation + 360° tilt, lockable). Probe holder gold-plated for IV testing. Base: adjustable magnetic (10Kg).
| Product Highlights | 5μm Universal Probe |
| Drive Mechanism | Magnetic adsorption (10Kg) |
| Material | Imported crossed roller guide rails |
| Movement Accuracy | 5 μm |
| X-Y-Z Stroke | 13mm XYZ + 360° rotation + 360° tilt |
| Guide Rail Type | Imported high-resolution differential head |
| Probe Holder Type | Imported aviation aluminum, sandblasted oxidation |
| Compatible Probe Diameter | Universal (360° rotation + 360° tilt, lockable), gold-plated |
| Motor Type | Crossed roller |
| Max Speed | Imported high-resolution differential head |
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