|Z| Probe PCB

Flexibility is critical for efficient PCB and ceramic testing. |Z| Probe® PCB features easy alignment, handling and positioning, and optimally replaces expensive and inflexible test fixtures. Robust design ensures easy handling and long operating life. The flat tip has precisely calculated parallel individual contact springs that move independently, enabling precise, fast and simple contact with the DUT even with significant contact height differences. When used with a manual probe system including probe positioner and calibration wafer, it is an ideal solution for all RF circuit probing.