Standard / Manual

Q: What is the difference between manual and semi-automatic probe stations?

Manual stations require operator probe placement, ideal for R&D. Semi-automatic stations use motorized stages for high-throughput production testing.

Q: Can I upgrade my manual station to RF later?

Yes, AIMRSE manual stations are field-upgradable to 40 GHz with RF positioners, bias tees, and low-loss cables.

Q: What microscope magnification is included?

Standard stereo-zoom microscope provides 7x to 45x total magnification. Higher magnification and digital cameras are optional.

Q: Can I probe wafers larger than 4 inches?

Standard station accommodates up to 4-inch wafers. Larger platens for 6-inch and 8-inch wafers are available.

Q: Is a vacuum pump required for the chuck?

Yes, a small oil-free diaphragm pump is required. We can supply one or you can use house vacuum with filtration.

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Cat	Products Name	Product Highlights	Price
AIMRSE-PS-S-21	Temperature-Controlled Probe Station	PID Temperature Control Probe	Request a Quote
AIMRSE-PS-S-22	Solar Cell Test Probe Station	Solar Cell Test Probe Station	Request a Quote
AIMRSE-PS-S-23	In-Situ Motorized Tensile Probe Station	In-Situ Tensile Probe Station	Request a Quote
AIMRSE-PS-S-24	Compact Analytical Probe Station	12-inch Compact Wafer Station	Request a Quote
AIMRSE-PS-S-25	Modular Analytical Probe Station	High-Sensitivity Modular Probe	Request a Quote
AIMRSE-PS-S-26	Analytical Probe Station - CPPSC Series	Mini Versatile Analytical Probe	Request a Quote
AIMRSE-PS-S-27	Temperature-Controlled Probe Station - CPPSH Series	High-Temp Anti-Oxidation Probe	Request a Quote
AIMRSE-PS-S-28	Material Tensile Test Probe Station	In-Situ Material Tensile Probe	Request a Quote
AIMRSE-PS-S-29	Precision Application Probe Station	Custom Research Probe Station	Request a Quote

Overview

Accessible Precision for Everyday Characterization: Not every measurement requires a fully automated cryogenic or high‑frequency system. For routine I‑V, C‑V, and failure analysis tasks, a reliable, ergonomic manual probe station is the cornerstone of an efficient laboratory. At AIMRSE, we manufacture Standard & Manual Probe Stations that deliver the mechanical precision and electrical performance of our advanced systems in a compact, cost‑effective benchtop format. Whether you are training students, performing quick device checks, or conducting failure analysis, our manual stations provide the stable probing platform you need without unnecessary complexity.

System Architecture & Benchtop Design

Fig 1: AIMRSE standard manual probe station configured for routine semiconductor device characterization.

AIMRSE manual probe stations are built on a vibration‑isolated base plate with a rigid platen that accommodates up to four micro‑positioners. A high‑resolution stereo‑zoom microscope with coaxial illumination provides clear visualization of probe tips and device features. The vacuum chuck secures wafers and substrates up to 4 inches in diameter, with an optional thermal chuck for temperature‑dependent measurements. All positioners offer sub‑micron resolution and magnetic or vacuum base mounting for flexible configuration. Despite their manual operation, these stations are fully compatible with our precision components and can be field‑upgraded with RF probes, shielded enclosures, or thermal control. Our manual stations are the preferred choice for university teaching laboratories, semiconductor failure analysis, basic device I‑V/C‑V screening, and MEMS device prototyping.

Available Manual Station Configurations

Benchtop Analytical Stations

Compact 4‑Inch Platform
Fully equipped with 4 micro‑positioners, stereo microscope, and vacuum chuck. Ideal for university labs, startup R&D, and basic semiconductor device characterization.

Thermal Manual Probe Stations

Ambient to 300 °C
Integrated thermal chuck with PID controller for temperature‑dependent I‑V measurements. Thermal isolation protects microscope and positioners from heat.

RF‑Ready Manual Platforms

Upgradeable to 40 GHz
Platen and positioner mounts pre‑configured for RF probe integration. Add RF positioners and cables as your measurement needs evolve.

Shielded Enclosure Options

EMI/RFI Suppression
Optional dark box enclosure with filtered feedthroughs for low‑current and low‑noise measurements. Ideal for photodetector and sensitive FET characterization.

Core Engineering Advantages

Rigid Mechanical Stability

The solid granite or aluminum base plate provides a stable, vibration‑damped platform for probe placement. Once positioned, probes maintain contact even during extended measurement sequences, ensuring consistent data.

Field‑Upgradeable Architecture

Start with a basic DC manual station and add capabilities as your research evolves. RF positioners, thermal chucks, and shielded enclosures can be retrofitted in the field without returning the system to the factory.

Ergonomic Operation

Positioners are arranged for intuitive access, and the microscope boom allows full 360° rotation for comfortable viewing. Coarse and fine adjustment knobs provide precise probe landing with minimal operator fatigue.

Manual Probe Station FAQ

What is the difference between manual and semi‑automatic probe stations?

A manual probe station requires the operator to position each probe tip individually using micromanipulators. This is ideal for R&D, failure analysis, and low‑volume testing. A semi‑automatic station uses motorized stages and pattern recognition to step across the wafer and contact predefined pads, suitable for production or high‑throughput testing. Manual stations offer lower cost and greater flexibility for non‑standard device layouts.

Can I upgrade my manual station to RF later?

Yes. AIMRSE manual stations are designed for field upgrades. You can add RF micro‑positioners, bias tees, and low‑loss cables to enable S‑parameter measurements up to 40 GHz. The platen and mounting hardware are pre‑tapped to accept our RF positioner bases.

What microscope magnification is included?

Standard configuration includes a stereo‑zoom microscope with 0.7× to 4.5× zoom range and 10× eyepieces, providing 7× to 45× total magnification. Higher magnification objectives and HD digital camera upgrades are available for finer feature resolution.

Can I probe wafers larger than 4 inches?

The standard manual station accommodates up to 4‑inch (100 mm) wafers. For 6‑inch or 8‑inch wafers, we offer larger platens and extended travel positioners. Please inquire about larger wafer configurations.

Is a vacuum pump required for the chuck?

Yes, a small diaphragm vacuum pump is required to secure the wafer or substrate to the chuck. We can supply a quiet, oil‑free pump suitable for laboratory environments, or you can use your existing house vacuum with appropriate filtration.

Custom Manual Station Services

Ready to Equip Your Lab with a Manual Probe Station?

From basic DC characterization to RF‑upgradable platforms, our team will help you select the right manual probe station for your current needs and future aspirations. Receive a detailed quotation and configuration drawing.

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Please specify wafer size, number of probes, and whether thermal or RF upgrades are anticipated.

Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.

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