Probe Tips

Q: Which probe tip material should I choose?

Tungsten for small geometries and aluminum; BeCu for high current; Gold-plated for low contact resistance.

Q: How do I select the correct tip radius?

Smaller than pad dimension: 0.5-2 µm for sub-micron gates, 10-25 µm for 100 µm pads.

Q: How often should I replace my probe tips?

Tungsten: 50k-100k touchdowns; BeCu: 10k-30k touchdowns. Inspect regularly for wear.

Q: Can I clean and reuse contaminated tips?

Light contamination can be cleaned with IPA; heavy contamination or damage requires replacement.

Q: Do you offer custom tip geometries?

Yes, custom radii, shank diameters, bend angles, and plating available upon request.

Request a Quote

Cat	Products Name	Product Highlights	Price
AIMRSE-C-PT-81	High-Frequency Semiconductor Test Probe 0.5A, 13.1GHz	0.5A 13.1GHz Test Probe	Request a Quote
AIMRSE-C-PT-82	1A Semiconductor Test Probe 13.1GHz, 1.24nH	1A 13.1GHz Test Probe	Request a Quote
AIMRSE-C-PT-83	1A Precision Test Probe 13.1GHz, 1.30nH	1A 13.1GHz Precision Probe	Request a Quote
AIMRSE-C-PT-84	2A Test Probe 7.5GHz, 1.46nH	2A 7.5GHz Test Probe	Request a Quote
AIMRSE-C-PT-85	2A High-Bandwidth Test Probe 14.8GHz, 1.29nH	2A 14.8GHz High‑Bandwidth	Request a Quote
AIMRSE-C-PT-86	2A Low-Inductance Test Probe 14.8GHz, 1.25nH	2A 14.8GHz Low‑Inductance	Request a Quote
AIMRSE-C-PT-87	2A Reliable Test Probe 14.8GHz, 1.30nH	2A 14.8GHz Reliable Probe	Request a Quote
AIMRSE-C-PT-88	2A Low-Frequency Test Probe 2.9GHz, 1.51nH	2A 2.9GHz Low‑Frequency Probe	Request a Quote
AIMRSE-C-PT-89	2A Precision Test Probe 13.1GHz, 1.24nH	2A 13.1GHz Precision Probe	Request a Quote
AIMRSE-C-PT-90	2A High-Performance Test Probe 14.8GHz, 1.25nH	2A 14.8GHz High‑Performance	Request a Quote

Overview

The Consumable That Defines Your Measurement: The probe tip is the single point of electrical contact between your instrument and your device. Its material, geometry, and condition directly determine contact resistance, wear life, and measurement repeatability. At AIMRSE, we supply Probe Tips manufactured to exacting tolerances for semiconductor, RF, and high‑power probing applications. Our tips are available in tungsten, beryllium copper, and gold‑plated variants, with tip radii from 0.5 µm to 50 µm. Whether you need sharp tungsten needles for sub‑micron gate probing or durable BeCu tips for production test, AIMRSE tips deliver the performance and consistency your measurements demand.

Tip Materials & Precision Manufacturing

Assortment of probe tips including tungsten, BeCu, and gold-plated variants Fig 1: AIMRSE probe tips in tungsten, beryllium copper, and gold‑plated configurations for diverse probing applications.

AIMRSE probe tips are precision‑ground and electropolished to achieve consistent tip geometry and surface finish. Tungsten tips offer exceptional hardness and sharpness, with tip radii down to 0.5 µm for probing advanced semiconductor nodes. Beryllium copper tips provide superior conductivity and ductility, making them ideal for high‑current applications and repeated touchdowns on hard pads. Gold‑plated tips minimize contact resistance and prevent oxidation on aluminum and copper bond pads. All tips are inspected under high magnification and shipped in protective packaging to ensure they arrive in pristine condition. Our probe tips are essential for wafer‑level device characterization, RF and mmWave probing, high‑power device testing, and failure analysis and debugging.

Available Probe Tip Configurations

Tungsten Probe Tips

Tip Radius 0.5 µm to 10 µm, High Hardness
Ideal for probing small geometry devices, advanced CMOS nodes, and applications requiring minimal pad damage. Long life on aluminum pads.

Beryllium Copper (BeCu) Tips

High Conductivity, Ductile, Tip Radius 5 µm to 50 µm
Preferred for high‑current and repetitive production testing. Softer material conforms to pad surface for low contact resistance.

Gold‑Plated Tips

Oxidation‑Resistant, Low Contact Resistance
Tungsten or BeCu cores with gold plating. Eliminates oxide formation on tips and pads. Essential for low‑voltage and low‑current measurements.

Specialty Probe Tips

Coaxial, High‑Voltage, and Custom Geometries
Tips for RF probing, high‑voltage breakdown testing, and custom applications. Bent shank, extended reach, and Kelvin configurations available.

Core Engineering Advantages

Consistent Tip Geometry

Every tip is precision‑ground to within ±0.5 µm of nominal radius. This ensures consistent contact area and pressure from tip to tip, eliminating a major source of measurement variability.

Electropolished Surface Finish

Tungsten tips receive an electropolish treatment that removes micro‑burrs and creates a smooth, uniform surface. This reduces contact resistance and prevents pad scratching during touchdown.

Universal Shank Compatibility

All AIMRSE probe tips feature standard 0.020″ (0.51 mm) or 0.050″ (1.27 mm) shank diameters, ensuring compatibility with AIMRSE probe holders and most industry‑standard positioners.

Probe Tip FAQ

Which probe tip material should I choose?

Tungsten for small geometries and aluminum pads; BeCu for high current and repeated touchdowns; Gold‑plated for low contact resistance and oxidation resistance on copper or gold pads.

How do I select the correct tip radius?

Tip radius should be smaller than the pad dimension but large enough to provide adequate contact area. For sub‑micron gates, use 0.5 µm–2 µm tips. For 100 µm pads, 10 µm–25 µm tips provide good contact and long life.

How often should I replace my probe tips?

Tip life depends on contact force, pad material, and touchdown frequency. Tungsten tips typically last 50,000–100,000 touchdowns on aluminum. BeCu tips last 10,000–30,000 touchdowns but provide lower resistance. Inspect tips regularly under a microscope for wear or contamination.

Can I clean and reuse contaminated tips?

Light contamination can be removed by gentle wiping with a lint‑free swab and isopropyl alcohol. For heavy contamination or physical damage, tip replacement is recommended to ensure measurement accuracy.

Do you offer custom tip geometries?

Yes. We can manufacture custom tip radii, shank diameters, bend angles, and plating options. Contact us with your specifications for a custom quote.

Custom Probe Tip Services

Need a Specific Probe Tip Configuration?

From custom tip radii and bend angles to specialized plating and shank modifications, our team can supply probe tips tailored to your unique device geometry and measurement requirements.

Request Quote

Please specify material, tip radius, shank diameter, and any special geometry or plating requirements.

Note: All AIMRSE probe systems and components are designed exclusively for professional semiconductor R&D and industrial testing. Equipment must be operated by trained personnel in accordance with standard laboratory safety protocols.

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